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E. Tan
Nanyang Technological University
Singapore
1 article by this author
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Research Article
Matrix Method to Detect Logic Hazards in Combinational Circuits with EX-OR Gates
E. Tan, M. Ho
10.3217/jucs-005-11-0765
 28-11-1999
 Unique: 289 | Total: 352  | Access Period:
 765-776
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